MIL-STD-810F Method 502.4 - Low Temperature
Low temperatures have adverse effects on almost all basic materiel. As a result, exposure of test items to low temperatures may either temporarily or permanently impair the operation of the test item by changing the physical properties of the material composing it. Therefore, low temperature test must be considered whenever the test item will be exposed to temperatures below standard ambient. Examples of some problems that could occur as the result of exposure to cold are:
The TDS Recon is tested to the Basic Cold (C1) standard of one 24-hour cycle at -30 C (-22° F). |